Download e-book for iPad: 1995 IEEE Conference on Lasers and Electro-Optics by IEEE Lasers & Electro-Optics Society

By IEEE Lasers & Electro-Optics Society

ISBN-10: 1559374004

ISBN-13: 9781559374002

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Extra resources for 1995 IEEE Conference on Lasers and Electro-Optics

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At the discretion of the manufacturer, the tests may also be performed as a O - t - CO - t' - CO, provided that for two opening operations the test current must be symmetrical at the time of contact part. In the case of three-phase tests the symmetry requirement is applicable only to one of the phases. For convenience in testing it is permissible to perform three C - O operations or a complete duty cycle O - t - CO - t' - CO instead of the O operations. These tests demonstrate the capability of the circuit breaker for switching low magnitudes of symmetrical short-circuit currents.

For circuit breakers equipped with arc shunting resistors of essentially constant value, restrikes through the primary or secondary arcing contacts shall fall within the following limitations. 1) Primary arcing contacts (during insertion of the arc shunting resistors). 31  ------------------------------------------------------------------------------------ A  pole-unit arc shunting resistance Ω 2) (9) there shall be no more than one restrike through the primary arcing contacts. For capacitance currents equal to or less than this value, multiple restrikes through the primary arcing contacts are permissible.

5°, which, as determined above, resulted in the longest capacitance current arcing time, not including reignition or restrike. 4) This is considered equivalent to 50 random three-phase operations. 04-1999) will be considered to have been met if there is no more than one operation with an overvoltage greater than the allowable limit. 04-1999) the performance will be considered to have been met if there are no operations with overvoltages greater than the allowable limit. The transient overvoltage factor shall be calculated by dividing the peak transient voltage by the line-to-ground peak value of the average of the open and closed circuit test voltage.

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1995 IEEE Conference on Lasers and Electro-Optics by IEEE Lasers & Electro-Optics Society


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